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Beilstein J. Nanotechnol. 2015, 6, 964–970, doi:10.3762/bjnano.6.99
Figure 1: EFTEM images of S1: (a) image in fresh area, (c) after about 10 min exposure to an intense electron...
Figure 2: EFTEM images of references samples S2 and S3: (a) S2 irradiated with a low dose, (b) S2 irradiated ...
Figure 3: EFTEM images of S4 (a,b) and S5 (c): (a) overview image of S4 illustrating severe sample damage cau...
Figure 4: EFTEM images and corresponding Si NC size distributions of S5-S9: (a) S5 (10 nm SiO0.93), (b) S6 (4...